Author: Burt, G.
Paper Title Page
SUPFDV007 Magnetic Field Penetration of Niobium Thin Films Produced by the ARIES Collaboration 77
 
  • D.A. Turner
    Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
  • G. Burt, K.D. Dumbell, O.B. Malyshev, R. Valizadeh
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • G. Burt
    Lancaster University, Lancaster, United Kingdom
  • E. Chyhyrynets, C. Pira
    INFN/LNL, Legnaro (PD), Italy
  • T. Junginger
    TRIUMF, Vancouver, Canada
  • T. Junginger
    UVIC, Victoria, Canada
  • S.B. Leith, M. Vogel
    University Siegen, Siegen, Germany
  • O.B. Malyshev, R. Valizadeh
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
  • A. Medvids
    Riga Technical University, Riga, Latvia
  • R. Ries
    Slovak Academy of Sciences, Institute of Electrical Engineering, Bratislava, Slovak Republic
  • E. Seiler
    IEE, Bratislava, Slovak Republic
  • A. Sublet
    CERN, Meyrin, Switzerland
  • J.T.G. Wilson
    STFC/DL, Daresbury, Warrington, Cheshire, United Kingdom
 
  Superconducting (SC) thin film coatings on Cu substrates are already widely used as an alternative to bulk Nb SRF structures. Using Cu allows improved thermal stability compared to Nb due to having a greater thermal conductivity. Niobium thin film coatings also reduce the amount of Nb required to produce a cavity. The performance of thin film Nb cavities is not as good as bulk Nb cavities. The H2020 ARIES WP15 collaboration studied the impact of substrate polishing and the effect produced on Nb thin film depositions. Multiple samples were produced from Cu and polished with various techniques. The polished Cu substrates were then coated with a Nb film at partner institutions. These samples were characterised with surface characterisation techniques for film morphology and structure. The SC properties were studied with 2 DC techniques, a vibrating sample magnetometer (VSM) and a magnetic field penetration (MFP) facility. The results conclude that both chemical polishing and electropolishing produce the best DC properties in the MFP facility. A comparison between the VSM and the MFP facility can be made for 10 micron thick samples, but not for 3 micron thick samples.  
poster icon Poster SUPFDV007 [1.059 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2021-SUPFDV007  
About • Received ※ 21 June 2021 — Accepted ※ 28 October 2021 — Issue date; ※ 09 April 2022  
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SUPFDV016 A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate 100
 
  • D.J. Seal
    Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
  • G. Burt, P. Goudket, O.B. Malyshev, B.S. Sian, R. Valizadeh
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • G. Burt, B.S. Sian
    Lancaster University, Lancaster, United Kingdom
  • J.A. Conlon, P. Goudket, O.B. Malyshev, R. Valizadeh
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
 
  A low-power SRF test facility is being upgraded at Daresbury Laboratory as part of the superconducting thin film testing programme. The facility consists of a bulk niobium test cavity operating at 7.8 GHz, surrounded by RF chokes, and can be run with input RF powers up to 1 W. It is housed within a liquid helium free cryostat and is able to test thin film planar samples up to 100 mm in diameter with a thickness between 1 and 20 mm. The RF chokes allow the cavity to be physically and thermally isolated from the sample, thus reducing the need for complicated sample mounting, whilst minimising field leakage out of the cavity. This allows for a fast turnaround time of two to three days per sample. Initial tests using a newly designed sample holder have shown that an RF-DC compensation method can be used successfully to calculate the surface resistance of samples down to 4 K. Potential upgrades include a pick-up antenna for direct measurements of stored energy and the addition of a self-excited loop to mitigate the effects of microphonics. Details of this facility and preliminary results are described in this paper.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2021-SUPFDV016  
About • Received ※ 21 June 2021 — Accepted ※ 12 August 2021 — Issue date; ※ 18 December 2021  
Cite • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)  
 
WEPFDV007 Main Highlights of ARIES WP15 Collaboration 571
 
  • O.B. Malyshev, P. Goudket, R. Valizadeh
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
  • C.Z. Antoine
    CEA-IRFU, Gif-sur-Yvette, France
  • O. Azzolini, E. Chyhyrynets, G. Keppel, C. Pira, F. Stivanello
    INFN/LNL, Legnaro (PD), Italy
  • G. Burt, D.J. Seal, D.A. Turner
    Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
  • G. Burt, B.S. Sian
    Lancaster University, Lancaster, United Kingdom
  • O. Kugeler, D.B. Tikhonov
    HZB, Berlin, Germany
  • S.B. Leith, A.O. Sezgin, M. Vogel
    University Siegen, Siegen, Germany
  • A. Medvids, P. Onufrijevs
    Riga Technical University, Riga, Latvia
  • R. Ries, E. Seiler
    Slovak Academy of Sciences, Institute of Electrical Engineering, Bratislava, Slovak Republic
  • B.S. Sian
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • A. Sublet, G. Vandoni, L. Vega Cid, W. Venturini Delsolaro, P. Vidal Garcia
    CERN, Geneva, Switzerland
  • D.A. Turner
    STFC/DL, Daresbury, Warrington, Cheshire, United Kingdom
 
  Funding: European Commission’s ARIES collaboration H2020 Research and Innovation Programme under Grant Agreement no. 730871
An international collaboration of research teams from CEA (France), CERN (Switzerland), INFN/LNL (Italy), HZB and USI (Germany), IEE (Slovakia), RTU (Latvia) and STFC/DL (UK), are working together on better understanding of how to improve the properties of superconducting thin films (ScTF) for RF cavities. The collaboration has been formed as WP15 in the H2020 ARIES project funded by EC. The systematic study of ScTF covers: Cu substrate polishing with different techniques (EP, SUBU, EP+SUBU, tumbling, laser), Nb, NbN, Nb3Sn and SIS film deposition and characterisation, Laser post deposition treatments, DC magnetisation characterisation, application of all obtained knowledge on polishing, deposition and characterisation, Laser post deposition treatments, DC magnetisation characterisation, application to the QPR samples for testing the films at RF conditions. The preparation, deposition and characterisation of each sample involves 3-5 partners enhancing the capability of each other and resulting in a more complete analysis of each film. The talk will give an overview of the collaborative research and will be an introduction to the detailed talks given by the team members.
 
poster icon Poster WEPFDV007 [2.008 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2021-WEPFDV007  
About • Received ※ 19 June 2021 — Accepted ※ 12 February 2022 — Issue date; ※ 10 April 2022  
Cite • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)