Author: Conlon, J.A.
Paper Title Page
SUPFDV016 A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate 100
  • D.J. Seal
    Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
  • G. Burt, P. Goudket, O.B. Malyshev, B.S. Sian, R. Valizadeh
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • G. Burt, B.S. Sian
    Lancaster University, Lancaster, United Kingdom
  • J.A. Conlon, P. Goudket, O.B. Malyshev, R. Valizadeh
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
  A low-power SRF test facility is being upgraded at Daresbury Laboratory as part of the superconducting thin film testing programme. The facility consists of a bulk niobium test cavity operating at 7.8 GHz, surrounded by RF chokes, and can be run with input RF powers up to 1 W. It is housed within a liquid helium free cryostat and is able to test thin film planar samples up to 100 mm in diameter with a thickness between 1 and 20 mm. The RF chokes allow the cavity to be physically and thermally isolated from the sample, thus reducing the need for complicated sample mounting, whilst minimising field leakage out of the cavity. This allows for a fast turnaround time of two to three days per sample. Initial tests using a newly designed sample holder have shown that an RF-DC compensation method can be used successfully to calculate the surface resistance of samples down to 4 K. Potential upgrades include a pick-up antenna for direct measurements of stored energy and the addition of a self-excited loop to mitigate the effects of microphonics. Details of this facility and preliminary results are described in this paper.  
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About • Received ※ 21 June 2021 — Accepted ※ 12 August 2021 — Issue date; ※ 18 December 2021  
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