Author: Fuwa, Y.
Paper Title Page
MOPFDV002 High Density Mapping Sytems for SRF Cavities 323
 
  • Y. Fuwa
    JAEA/J-PARC, Tokai-mura, Japan
  • R.L. Geng
    JLab, Newport News, Virginia, USA
  • Y. Iwashita, Y. Kuriyama
    Kyoto University, Research Reactor Institute, Osaka, Japan
  • H. Tongu
    Kyoto ICR, Uji, Kyoto, Japan
 
  High density mapping systems for superconducting cavities are prepared. They include sX-map, XT-map and B-map. Each strip of the sX-map system has 32 X-ray sensors approximately 10 mm apart, which can be installed under the stiffener rings to show uniform higher sensitivities. This is suitable to get X-ray distribution around iris areas. The XT-map system enables temperature distribution mapping of cavity cells with high spatial resolution at approximately 10 mm intervals in both azimuth and latitude. It also gives X-ray distribution on cells, as well. Magnetic field distributions can be obtained by B-map system using AMR sensors. Since all these systems are based on the technology of multiplexing at cryogenic side, less number of wires can carry the huge number of signals. The systems are described.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2021-MOPFDV002  
About • Received ※ 02 July 2021 — Revised ※ 19 December 2021 — Accepted ※ 22 January 2022 — Issue date ※ 02 May 2022
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TUPFDV008 Instrumentation R&D for the Studies of SRF Thin-Film Structures at KEK and Kyoto University 421
 
  • Y. Fuwa
    JAEA/J-PARC, Tokai-mura, Japan
  • H. Hayano, H. Ito, R. Katayama, T. Kubo, T. Saeki
    KEK, Ibaraki, Japan
  • Y. Iwashita, Y. Kuriyama
    Kyoto University, Research Reactor Institute, Osaka, Japan
  • H. Tongu
    Kyoto ICR, Uji, Kyoto, Japan
 
  We have been developing SRF instrumentations by which the effective lower critical magnetic field Hc1,eff of superconducting-material sample is evaluated through the method of the third-order harmonic voltage measurement mainly for the studies of new SRF thin-film structures. Recently, the quad coil system, which enables us to measure four samples simultaneously in a single batch of an experiment, has been developed. In order to study the creation of thin-film structures inside the SRF cavity, we developed 3-GHz-shaped coupon cavities and an XT-map system for the performance tests of 3 GHz cavities. This article reports the details of these works.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2021-TUPFDV008  
About • Received ※ 01 July 2021 — Revised ※ 19 December 2021 — Accepted ※ 02 April 2022 — Issue date ※ 02 May 2022
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