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RIS citation export for SUPFDV016: A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate

AU  - Seal, D.J.
AU  - Burt, G.
AU  - Conlon, J.A.
AU  - Goudket, P.
AU  - Malyshev, O.B.
AU  - Sian, B.S.
AU  - Valizadeh, R.
ED  - Saito, Kenji
ED  - Xu, Ting
ED  - Sakamoto, Naruhiko
ED  - Lesage, Ana
ED  - Schaa, Volker R.W.
TI  - A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate
J2  - Proc. of SRF2021, East Lansing, MI, USA, 28 June-02 July 2021
CY  - East Lansing, MI, USA
T2  - International Conference on RF Superconductivity
T3  - 20
LA  - english
AB  - A low-power SRF test facility is being upgraded at Daresbury Laboratory as part of the superconducting thin film testing programme. The facility consists of a bulk niobium test cavity operating at 7.8 GHz, surrounded by RF chokes, and can be run with input RF powers up to 1 W. It is housed within a liquid helium free cryostat and is able to test thin film planar samples up to 100 mm in diameter with a thickness between 1 and 20 mm. The RF chokes allow the cavity to be physically and thermally isolated from the sample, thus reducing the need for complicated sample mounting, whilst minimising field leakage out of the cavity. This allows for a fast turnaround time of two to three days per sample. Initial tests using a newly designed sample holder have shown that an RF-DC compensation method can be used successfully to calculate the surface resistance of samples down to 4 K. Potential upgrades include a pick-up antenna for direct measurements of stored energy and the addition of a self-excited loop to mitigate the effects of microphonics. Details of this facility and preliminary results are described in this paper.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 100
EP  - 104
KW  - cavity
KW  - niobium
KW  - controls
KW  - pick-up
DA  - 2022/10
PY  - 2022
SN  - 2673-5504
SN  - 978-3-95450-233-2
DO  - doi:10.18429/JACoW-SRF2021-SUPFDV016
UR  - https://jacow.org/srf2021/papers/supfdv016.pdf
ER  -